July 21 - 25, Zürich, Switzerland
X-ray microscopy is a rapidly expanding field. Thanks to advances in synchrotron and laboratory based x-ray sources and to improvements in x-ray optics, it is now possible to investigate matter with x-rays down to spatial scales of a few 10nm. By exploiting polarization, phase and tunable energy of the x-rays a wealth of imaging and contrast mechanisms are available.
Using emerging techniques like coherent imaging and ever improving focussing devices spatial resolutions below 10nm seem feasable in the near future.
XRM2008 will bring together the world wide community working on instrumentation and application of x-ray microscopy. It will serve as a forum to present the current status and discuss future directions. XRM2008 follows a series of highly successfull conferences which has started in G÷ttingen 1984.
To broaden the view of people working in the field of x-ray microscopy, XRM2008 will also feature non x-ray based microscopy techniques. This will hopefully stimulate collaborations and further progress in the field.
- Applications of X-Ray Microscopy
- Biology and medical sciences
- Materials and surface sciences
- Soft condensed matter
- Mineralogy, earth and planetary sciences
- Environmental science
- Methods and Novel Approaches
- Focussing and imaging optics
- Coherent and phase-contrast imaging
- X-Ray Microscopy Instrumentation
- Developement of new microscopes
- Micro- and nanometer and x-ray optics
- X-ray sources, optical elements and detectors
- Alternative Techniques
- Visible light microscopy (sub diffraction limited near- and far-field microscopy)
- Scanning probe techniques
- Aberration corrected electron microscopy
- Scattering techniques (small- and ultra-small angle scattering)
- X-ray imaging in astronomy