9th International Conference on X-Ray Microscopy
July 21 - 25, Zürich, Switzerland

Speakers

Invited Speakers

Name Institiution Topic
Prof. H. Ade North Carolina State University, USA Microscopy on Polymers: From Science to Applications
Prof. Sadao Aoki University of Tsukuba, Japan Zernike Phase Contrast Microscopy
Dr. Henry Chapman Deutsches Elektronen Synchrotron, Germany Coherent imaging at FLASH
Dr. Peter Cloetens European Synchrotron Radiation Facility, France Toward X-Ray Nanotomography
Dr. Michael Feser Xradia, USA Status and future of commercial X-ray microscopes
Prof. Janos Kirz Lawrence Berkeley Lab., Advanced Light Source, USA The History and Future of X-Ray Microscopy
Dr. Jörg Maser Argonne, Natl. Lab., Advanced Photon Source, USA The hard X-Ray Nanoprobe at APS
Dr. Ian McNulty Argonne, Natl. Lab., Advanced Photon Source, USA Orbital Moment of X-Ray Photons
Dr. Piere Thibault Paul Scherrer Institut, Swiss Light Source, Switzerland Ptychographical coherent diffractive Imaging
Dr. Murielle Salome European Synchrotron Radiation Facility, France Fluorescence X-ray micro-spectroscopy activities at ESRF
Dr. Gerd Schneider BESSY, Germany Very high resolution full field x-ray microscopy
Dr. H. Stoll Max Plank Institut für Metallforschung, Germany Magnetization dynamics in nanostructures
Dr. Yoshio Suzuki SPring8, Japan Hard x-ray imaging holography and tomography
Dr. Garth Williams University of Melbourne, Australia Divergent Beam Coherent Diffractive Imaging
Dr. Hwa Shik Youn Pohang Accelerator Laboratory, Korea Observation of Bio-Fibers with a Hard X-ray Microscope

 

Complementary Lectures

Name Institiution Topic
Prof. Stefan Hell MPI for Biophysical Chemistry, Germany STED and 4Pi microscopy
Prof. Roberto Otero Universidad Autónoma de Madrid, Spain Time resolved Microscopy of Surfaces
Prof. John Rodenburg Univ. Sheffield, UK Electron holography as a counterpart to x-ray holography
Prof. Viola Vogel Department of Materials ETH Zurich The hidden life of stretched proteins

Complementary lectures will be given by internationally renown experts working in fields complementary to X-ray microscopy. They will allow participants to benchmark their own work and the status of the field.